The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Feb. 20, 2012
Damon Hachmeister, North Grafton, MA (US);
Adam Jenkins, Marlborough, MA (US);
Sudarshan Raghunathan, Cambridge, MA (US);
Damon Hachmeister, North Grafton, MA (US);
Adam Jenkins, Marlborough, MA (US);
Sudarshan Raghunathan, Cambridge, MA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A serial testing infrastructure includes the capability to execute a distributed test on multiple virtual processors. A test executable may be stored in a library and the test description, including the name of the test, the test library, and other test characteristics, may be stored in a separate test data file. The serial testing infrastructure initiates multiple distributed test executors that each launch an instance of the distributed test as a process that runs concurrently with other instances of the distributed test. Each distributed test executor monitors execution of it corresponding process until completion or timeout.