The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Apr. 29, 2011
Applicants:

Sven Hedlund, Genarp, SE;

Benny Klein, Bara, SE;

Inventors:

Sven Hedlund, Genarp, SE;

Benny Klein, Bara, SE;

Assignee:

Cella Vision AB, Lund, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01); G03B 13/00 (2006.01); H04N 5/232 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G02B 21/365 (2013.01);
Abstract

The present invention relates to a method, an analyzer and a computer program product for focus prediction in a sample arranged on a measuring surface of an analyzer. The method comprises row wise scanning sample positions by means of an optical system of said analyzer, said sample positions being positions in a coordinate system for said measuring surface containing said sample, for the first sample position on each row, determining a focus and storing said focus, and for each subsequent sample position: if a stored difference exists, predicting a focus by adding said stored difference to said stored focus, or if no stored difference exists, determining a focus and storing said focus.


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