The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Jan. 31, 2012
Applicants:

Aleksandar Uzelac, Seattle, WA (US);

David A. Stevens, Sammamish, WA (US);

Andrey B. Batchvarov, Redmond, WA (US);

Changsin Lee, Redmond, WA (US);

Takahiro Shigemitsu, Bellevue, WA (US);

Inventors:

Aleksandar Uzelac, Seattle, WA (US);

David A. Stevens, Sammamish, WA (US);

Andrey B. Batchvarov, Redmond, WA (US);

Changsin Lee, Redmond, WA (US);

Takahiro Shigemitsu, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G21C 17/00 (2006.01); G06F 3/041 (2006.01); G06F 3/043 (2006.01);
U.S. Cl.
CPC ...
Abstract

Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.


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