The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Mar. 30, 2012
Applicants:

Shinobu Adachi, Nara, JP;

Jun Ozawa, Nara, JP;

Yoshihisa Terada, Tokyo, JP;

Koji Morikawa, Kyoto, JP;

Inventors:

Shinobu Adachi, Nara, JP;

Jun Ozawa, Nara, JP;

Yoshihisa Terada, Tokyo, JP;

Koji Morikawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/04 (2006.01); A61B 5/048 (2006.01);
U.S. Cl.
CPC ...
A61B 5/048 (2013.01); A61B 2560/0276 (2013.01);
Abstract

An exemplary electroencephalogram measurement system includes: a frequency analysis section for, analyzing a frequency power of the electroencephalogram signal of a user with respect to each set of a reference electrode and a measurement electrode; an insufficient electrode determination section for, through comparison of the analyzed frequency power against a first threshold value, distinguishing whether a state of attachment of each electrode is sufficient or not; and an insufficiency cause estimation section for determining the number of insufficient electrodes distinguished as insufficiently worn, determining a position at which each insufficient electrode is in contact with the user, and estimating a cause for the insufficient state of attachment of the insufficient electrode or electrodes that corresponds to the determined number of insufficient electrodes and position of each insufficient electrode by referring to insufficiency pattern data.


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