The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Nov. 09, 2012
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Seoul National University R&b Foundation, Seoul, KR;
Yun-Jung Kim, Seoul, KR;
Sang-Hwa Lee, Seoul, KR;
Nam-Ik Cho, Seoul, KR;
Jae-Hyun An, Seoul, KR;
Sung-Dae Cho, Gyeonggi-do, KR;
Abstract
A method of controlling an image analysis apparatus is provided. The method includes receiving a query image; determining at least one main color distributed in the query image and a specific main color from among the at least one main color by using color information contained in the query image; dividing the query image into at least one block having a predetermined number of pixels; and determining whether each of the at least one block includes more than a predetermined percentage of a main color for comparison among the at least main color, and creating a binary spatial distribution map by digitizing the at least one block.