The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Jan. 03, 2012
Masayuki Nakatsuka, Tokyo, JP;
Hiroshi Fujiki, Tokyo, JP;
Masayuki Nakatsuka, Tokyo, JP;
Hiroshi Fujiki, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
Proper exposure is achieved within a short period of time even when image-acquisition elements are switched. Provided is an image-acquisition device for a microscope, which includes an optical-path branching section that branches light from an object into two optical paths; a first image-acquisition element and a second image-acquisition element that are respectively disposed in the two optical paths branching from the optical-path branching section and that acquire images of the light from the object under different image-acquisition conditions; and an exposure-time calculator that calculates an exposure time for the second image-acquisition element on the basis of an exposure time for the first image-acquisition element and a ratio of the image-acquisition conditions of the first and second image-acquisition elements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile