The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Oct. 01, 2009
Applicants:

Bart G. B. Barenbrug, Eindhoven, NL;

Christian Benien, Eindhoven, DE;

Harald H. A. Van Woerkom, Eindhoven, NL;

Inventors:

Bart G. B. Barenbrug, Eindhoven, NL;

Christian Benien, Eindhoven, DE;

Harald H. A. Van Woerkom, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/04 (2006.01); H04N 9/47 (2006.01); H04N 19/597 (2014.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0022 (2013.01); H04N 19/00769 (2013.01); H04N 13/0066 (2013.01); H04N 13/0018 (2013.01);
Abstract

This invention relates to a method and a device of processing parallax information comprised in a signal. A signal comprising parallax map associated with further image information is received. A first data is obtained from the signal indicative of first parallax map constraints. A second data is obtained from the signal indicative of second parallax map constraints. Third data matching third parallax map constraints of a target device is determined by means of processing the at least the first data and the second data. This third data is used to generate an updated signal matching the parallax map information constraints of the target device.


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