The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Dec. 16, 2009
Applicants:

Dong Tian, Plainsboro, NJ (US);

Po-lin Lai, Plainsboro, NJ (US);

Inventors:

Dong Tian, Plainsboro, NJ (US);

Po-Lin Lai, Plainsboro, NJ (US);

Assignee:

Thomson Licensing, Boulogne-Billancourt, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 13/00 (2006.01); H04N 7/26 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0071 (2013.01); G06T 2207/10016 (2013.01);
Abstract

Various implementations are described. Several implementations relate to joint depth estimation for multiple depth maps. In one implementation, a first-view depth indicator for a location in a first view is estimated, and a second-view depth indicator for a corresponding location in a second view is estimated. The estimating of one or more of the first-view depth indicator and the second-view depth indicator is based on a constraint. The constraint provides a relationship between the first-view depth indicator and the second-view depth indicator for corresponding locations.


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