The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Aug. 09, 2006
Applicant:

Manish S. Kulkarni, Saratoga, CA (US);

Inventor:

Manish S. Kulkarni, Saratoga, CA (US);

Assignee:

Adobe Systems Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); H04N 1/60 (2006.01); G06F 1/035 (2006.01); G06F 17/17 (2006.01);
U.S. Cl.
CPC ...
H04N 1/6019 (2013.01); G06F 1/035 (2013.01); G06F 17/17 (2013.01);
Abstract

The present disclosure includes systems and techniques relating to identifying function samples for use in interpolation. In general, in one implementation, the technique includes: obtaining a set of unevenly spaced sample points, x, and corresponding sample outputs, y, of a function y=f(x) within a domain; generating a data structure including first locations corresponding to a set of evenly spaced sample points within the domain, wherein the first locations store index values corresponding to second locations storing the sample outputs, y; receiving an input value of image data; identifying one of the first locations corresponding to the input value; finding two index values stored in the first locations using the one of the first locations as a starting point; and generating an image data output value corresponding to the input value by interpolation using two sample outputs, y, obtained from the second locations using the two index values.


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