The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8913061 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 16, 2014

Filed:

Dec. 23, 2010
Applicants:

Nan-yow Chen, Taipei County, TW;

Ting-kuo Lee, Taipei, TW;

Inventors:

Nan-Yow Chen, Taipei County, TW;

Ting-Kuo Lee, Taipei, TW;

Assignee:

Academia Sinica, Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20148 (2013.01); G06T 2207/30101 (2013.01);
Abstract

This invention provides an automatic tracing algorithm for quantitative analysis of continuous structures, such as the images of tree-like or network-like structures. The algorithm includes the steps of encoding 3-D image voxels by using a source field encoding methodology followed by a defined image threshold, tracing the codelets along encoded voxels such that the characteristic element of a 3-D image such as the center line of fiber, fiber branch, loop, and end point can be determined systematically, and achieving the automatic analysis without manual intervention. In addition, quantitative measurements are exquisitely calculated by the location and distance of these characteristic elements between coded voxels. The algorithm is more suitable to automatically analyze the 2D/3D images of complex neurons, blood vessels, collagens in skin tissue, and fibril morphology in polymeric materials.


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Chen, Nan-Yow. (2014). Automatic tracing algorithm for quantitative analysis of continuous structures (U.S. Patent No. 8913061). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8913061

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