The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Feb. 15, 2012
Applicants:

Holger Tietjen, Hannover, DE;

Mouin Hamdan, Celle, DE;

Inventors:

Holger Tietjen, Hannover, DE;

Mouin Hamdan, Celle, DE;

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus using at least one process to reduce a data set using a data adaptive down-sampling scheme comprising a plurality of non-uniform down-sampling factors. The method may include separating the data set into a plurality of data windows, where each of the plurality of data windows corresponds to one of the plurality of non-uniform data-sampling factors; applying the down-sampling factors, and transmitting the reduced data set from a downhole location to the surface. The data set may include an NMR echo train. The apparatus may include an NMR tool configured to acquire NMR data and at least one processor configured to perform the method.


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