The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Jan. 23, 2012
Applicants:

Jeffrey C. Sherry, Savage, MN (US);

Patrick J. Alladio, Santa Rosa, CA (US);

Russell F. Oberg, Beldenville, WI (US);

Brian K. Warwick, Ben Lomond, CA (US);

Inventors:

Jeffrey C. Sherry, Savage, MN (US);

Patrick J. Alladio, Santa Rosa, CA (US);

Russell F. Oberg, Beldenville, WI (US);

Brian K. Warwick, Ben Lomond, CA (US);

Assignee:

Johnstech International Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/073 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0735 (2013.01); G01R 1/06716 (2013.01); H01L 24/10 (2013.01); G01R 1/06738 (2013.01); H01L 2224/13099 (2013.01); H01L 2924/01002 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/14 (2013.01); H01L 2924/30105 (2013.01); H01L 2924/30107 (2013.01); H01L 2924/3011 (2013.01); H01L 2924/3025 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01019 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01076 (2013.01); H01L 2924/014 (2013.01);
Abstract

A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture ().


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