The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Sep. 09, 2011
Applicants:
Gert Nutzel, Delft, NL;
Pascal Lavoute, Brive la Gaillarde, FR;
Richard B. Jackman, Hertfordshire, GB;
Inventors:
Gert Nutzel, Delft, NL;
Pascal Lavoute, Brive la Gaillarde, FR;
Richard B. Jackman, Hertfordshire, GB;
Assignee:
Photonis France, Brive, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 31/18 (2006.01); H01L 31/028 (2006.01); G01T 1/28 (2006.01); H01J 1/32 (2006.01); H01J 43/18 (2006.01); H01J 43/24 (2006.01); H01J 9/12 (2006.01); B82Y 30/00 (2011.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
H01L 31/028 (2013.01); H01L 31/1804 (2013.01); Y10S 977/755 (2013.01); B82Y 15/00 (2013.01); G01T 1/28 (2013.01); H01J 1/32 (2013.01); H01J 43/18 (2013.01); H01J 43/246 (2013.01); H01J 9/125 (2013.01); B82Y 30/00 (2013.01);
Abstract
An electron multiplier for a system for detecting electromagnetic radiation or an ion flow is disclosed. The multiplier includes at least one active structure intended to receive a flow of incident electrons, and to emit in response a flow of electrons called secondary electrons. The active structure includes a substrate on which is positioned a thin nanodiamond layer formed from diamond particles the average size of which is less than or equal to about 100 nm.