The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Aug. 17, 2011
Applicants:

James A. Chervenak, Silver Spring, MD (US);

Ari D. Brown, Baltimore, MD (US);

Edward J. Wollack, Clarksville, MD (US);

Dominic J. Benford, Potomac, MD (US);

Inventors:

James A. Chervenak, Silver Spring, MD (US);

Ari D. Brown, Baltimore, MD (US);

Edward J. Wollack, Clarksville, MD (US);

Dominic J. Benford, Potomac, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 3/02 (2006.01); G01J 5/08 (2006.01); G01J 3/42 (2006.01); G01J 5/20 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01J 3/0227 (2013.01); G01J 5/0828 (2013.01); G01J 3/42 (2013.01); G01J 5/0837 (2013.01); G01J 5/20 (2013.01); G01N 21/3581 (2013.01);
Abstract

An apparatus for ultrasensitive long-wave imaging cameras is provided. In one embodiment, the apparatus includes a filter configured to allow high frequencies of interest to pass through the filter. The apparatus also includes an antenna that is configured to receive the high frequencies of interest. The apparatus further includes a plurality of bolometers that are configured to measure data regarding the high frequencies of interest.


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