The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Apr. 30, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yu-Shan Chang, Taichung, TW;

Sen-Yih Chou, Hsinchu, TW;

Chia-Hung Cho, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0411 (2013.01);
Abstract

A display measuring device for measuring a display, includes a photosensitive unit, a first rotation plane mirror, a second rotation plane mirror, a first lens module, a second lens module, and an optic reflecting unit. The first lens module projects a first incident image from the display to the first rotation plane mirror. The first rotation plane mirror reflects the projected first incident image from the first lens module to the optic reflecting unit. The second lens module projects a second incident image from the display to the second rotation plane mirror. The second rotation plane mirror reflects the projected second incident image from the second lens module to the optic reflecting unit. The optic reflecting unit reflects the reflected first incident image to the photosensitive unit, and reflects the reflected second incident image to the photosensitive unit.


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