The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Feb. 18, 2014
Applicant:
Quidel Corporation, San Diego, CA (US);
Inventors:
Nikol Lee De Forest, Scotts Valley, CA (US);
John Tamerius, San Diego, CA (US);
Noah Nasser, San Marcos, CA (US);
Patrick Sexton, Windsor, CO (US);
Assignee:
Quidel Corporation, San Diego, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 33/68 (2006.01); G01N 33/564 (2006.01); C07K 16/18 (2006.01);
U.S. Cl.
CPC ...
G01N 33/689 (2013.01); G01N 33/564 (2013.01); C07K 16/18 (2013.01); G01N 2800/368 (2013.01); C07K 2317/33 (2013.01);
Abstract
Methods, compositions and kits for detecting the complement Factor B cleavage product Ba in a biological sample are described. These methods, compositions and kits are useful in convenient, reliable and early diagnosis of or ruling out pre-eclampsia in a pregnant human subject.
De Forest, Nikol. (2014). Methods of use for an immunoassay detecting fragment ba (U.S. Patent No. 8911956). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8911956
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile