The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Apr. 01, 2010
Takuya Nakazono, Ibaraki, JP;
Seiji Umemoto, Ibaraki, JP;
Tomohito Takita, Ibaraki, JP;
Fumihito Shimanoe, Ibaraki, JP;
Yuuki Yano, Ibaraki, JP;
Teruaki Oosawa, Ibaraki, JP;
Takuya Nakazono, Ibaraki, JP;
Seiji Umemoto, Ibaraki, JP;
Tomohito Takita, Ibaraki, JP;
Fumihito Shimanoe, Ibaraki, JP;
Yuuki Yano, Ibaraki, JP;
Teruaki Oosawa, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, JP;
Abstract
Disclosed is a material roll that includes a roll of an optical film having defect information markings printed thereon and is resistant to the formation of a defect by the transfer of a bump/dent deformation at the marking site. The material roll includes a long sheet of an optical film with polarizer wound into roll shape; and marking(s) formed at or in a vicinity of at least one defect site. The marking has an optical density of 1.5 or more, and a thickness of a center part of the marking is 1.5 μm or less. The marking preferably has an optical density per unit thickness of 2.5 μmor more.