The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Sep. 05, 2007
Yutaka Ohmori, Ibaraki, JP;
Takahisa Konishi, Ibaraki, JP;
Hisae Sugihara, Ibaraki, JP;
Miyuki Kurogi, Ibaraki, JP;
Toshiyuki Iida, Ibaraki, JP;
Yutaka Ohmori, Ibaraki, JP;
Takahisa Konishi, Ibaraki, JP;
Hisae Sugihara, Ibaraki, JP;
Miyuki Kurogi, Ibaraki, JP;
Toshiyuki Iida, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, JP;
Abstract
The retardation film of the present invention contains a thermoplastic polymer having at least a side chain component (A) oriented in a direction substantially orthogonal to a slow axis, and the absorption edge wavelength (λ) of the side chain component (A) is 330 nm or more, and an in-plane retardation value (Re[450]) at a wavelength of 450 nm is smaller than that (Re[650]) at a wavelength of 650 nm. In the above-mentioned retardation film, the difference (ΔRe=Re[650]−Re[450]) between the in-plane retardation value (Re[650]) at a wavelength of 650 nm and the in-plane retardation value (Re[450]) at a wavelength of 450 nm is preferably 10 nm or more. The retardation film of the present invention exhibits optical characteristics in which the in-plane birefringence is large and the difference between a retardation value on the short wavelength side and a retardation value on the long wavelength side is large.