The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

May. 17, 2012
Applicants:

Cheng-che Chung, Tainan, TW;

I-fang Cheng, Tainan, TW;

Wen-horng Yang, Tainan, TW;

Hsien-chang Chang, Tainan, TW;

Inventors:

Cheng-Che Chung, Tainan, TW;

I-Fang Cheng, Tainan, TW;

Wen-Horng Yang, Tainan, TW;

Hsien-Chang Chang, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 33/15 (2006.01); C12Q 1/18 (2006.01);
U.S. Cl.
CPC ...
G01N 33/15 (2013.01); C12Q 1/18 (2013.01);
Abstract

A method of antibiotic susceptibility testing is disclosed, and includes the following steps: (A) providing a sample to be tested wherein the sample contains a microbe; (B) adding an antibiotic into the sample, wherein the antibiotic serves to inhibit cell wall synthesis; (C) checking the sample by dielectrophoresis and observing a shape change of the microbe; and (D) determining whether the microbe is susceptible to the antibiotic according to the shape change thereof. The present invention also discloses a method for determining a minimum inhibitory concentration of the antibiotic.


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