The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Dec. 18, 2009
Applicant:

Toshihiko Omori, Kanagawa, JP;

Inventor:

Toshihiko Omori, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/005 (2006.01); A61B 5/00 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/6852 (2013.01); A61B 1/00096 (2013.01); A61B 1/00193 (2013.01); A61B 5/0084 (2013.01); A61B 5/0066 (2013.01); A61B 1/00009 (2013.01); A61B 1/00133 (2013.01); A61B 1/00172 (2013.01);
Abstract

In the optical structure observation apparatus according to an aspect of the present invention, a middle layer of a measured object having a layer structure at least including a surface layer and the middle layer is extracted and flattened to be a same flat plane, the optical stereoscopic structure image is reconstructed with the flattened middle layer as the reference layer, the three-dimensional converted optical structure image is generated, and at least the three-dimensional converted optical structure image is imaged and displayed on the display device, whereby the structure information with the middle layer in the measured object having the layer structure as a basal plate can be visually determined.


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