The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
May. 19, 2014
Hexagon Metrology, Inc., North Kingstown, RI (US);
Jonathan J. O'Hare, Warwick, RI (US);
Stephen Darrouzet, West Warwick, RI (US);
Hexagon Metrology, Inc., North Kingstown, RI (US);
Abstract
An apparatus for calibrating an x-ray computed tomography device has a plurality of objects formed from a material that is visible to x-rays, and a base at least in part fixedly supporting the plurality of objects so that each of the plurality of objects contacts at least one of the other objects. Each one of the plurality of objects: 1) is configured to receive x-rays without changing shape, 2) has substantially the same shape and size as the other objects, 3) has an attenuation value to x-rays ('object attenuation value'), and 4) is symmetrically shaped relative to its center point. Like the objects, the base also has an attenuation value to x-rays (the 'base attenuation value'). The object attenuation value is greater than the base attenuation. Each of the plurality of objects is kinematically locked in place on the base.