The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Oct. 07, 2010
Applicant:
Yoshirou Yamazaki, Kanagawa-ken, JP;
Inventor:
Yoshirou Yamazaki, Kanagawa-ken, JP;
Assignee:
FujiFilm Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/28 (2006.01); B41J 29/393 (2006.01); B41J 2/21 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/2146 (2013.01);
Abstract
A dot position measurement method and a dot position measurement apparatus provide a plurality of common line blocks and averaging measurement values of positions of lines in each common line blocks when correcting the measurement positions in each line block by taking a common line block (reference line block) as a reference position, and it is possible to reduce effects of random positional variation in a main scanning direction of an image reading apparatus.
Yamazaki, Yoshirou. (2014). Dot position measurement method and dot position measurement apparatus (U.S. Patent No. 8911055). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8911055
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile