The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Mar. 27, 2013
Applicant:

Masahiro Nishihara, Nagoya, JP;

Inventor:

Masahiro Nishihara, Nagoya, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

In recording on a back side of a sheet in duplex recording, an overlapping pixel where both a pixel in back-side image data and a pixel opposed thereto in front-side image data has a gray level value larger than zero is retrieved from the front-side and back-side image data. A block area containing at least a predetermined number of overlapping pixels is extracted as an overlap area from block areas arranged in a matrix in the back-side image data. The area drying time in a block area other than the overlap area is determined from the volume of droplets to be ejected to the back side. The area drying time in the overlap area is determined from the total volume of droplets to be ejected to the front and back sides. The maximum area drying time is determined to be the drying time for the back side.


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