The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Apr. 06, 2010
Wolfram Bauer, Tuebingen, DE;
Johannes Classen, Reutlingen, DE;
Rainer Willig, Tamm, DE;
Matthias Meier, Reutlingen, DE;
Burkhard Kuhlmann, Reutlingen, DE;
Mathias Reimann, Ditzingen, DE;
Ermin Esch, Pliezhausen, DE;
Hans-dieter Schwarz, Balingen, DE;
Michael Veith, Reutlingen, DE;
Christoph Lang, Cupertino, CA (US);
Udo-martin Gomez, Leonberg, DE;
Wolfram Bauer, Tuebingen, DE;
Johannes Classen, Reutlingen, DE;
Rainer Willig, Tamm, DE;
Matthias Meier, Reutlingen, DE;
Burkhard Kuhlmann, Reutlingen, DE;
Mathias Reimann, Ditzingen, DE;
Ermin Esch, Pliezhausen, DE;
Hans-Dieter Schwarz, Balingen, DE;
Michael Veith, Reutlingen, DE;
Christoph Lang, Cupertino, CA (US);
Udo-Martin Gomez, Leonberg, DE;
Robert Bosch GmbH, Stuttgart, KR;
Abstract
A yaw rate sensor () includes a movable mass structure () and a drive component () which is suitable for setting the movable mass structure () in motion (), and an analysis component () which is suitable for detecting a response () of the movable mass structure () to a yaw rate (Ω). A method for functional testing of a yaw rate sensor () includes the following steps: driving a movable mass structure (), feeding a test signal () into a quadrature control loop () at a feed point () of the quadrature control loop (), feeding back a deflection () of the movable mass structure (), detecting a measure of the feedback of the movable mass structure (), and reading out the response signal () from the quadrature control loop (). In the yaw rate sensor () and also in the method, the readout of the response signal () in relation to a processing direction () of the test signal () is provided between a feed point () for a test signal () and an actuator () for feeding back a deflection () of the movable mass structure ().