The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8910146 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 09, 2014

Filed:

Jun. 09, 2012
Applicants:

Nnaemeka I. Emejulu, Austin, TX (US);

Andrew J. Lavery, Austin, TX (US);

YE Liu, Belmont, MA (US);

Mario A. Maldari, Longmont, CO (US);

Inventors:

Nnaemeka I. Emejulu, Austin, TX (US);

Andrew J. Lavery, Austin, TX (US);

Ye Liu, Belmont, MA (US);

Mario A. Maldari, Longmont, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one aspect of the present disclosure, a method and technique for automated time-to-value (TTV) measurement is disclosed. The method includes: initiating an installation module of an application to install the application on a data processing system; responsive to initiating installation of the application via the installation module, monitoring, via a TTV module of the application, a time period associated with the installation of the application; and recording, by the TTV module, the time period corresponding to the installation of the application.


Find Patent Forward Citations

Emejulu, Nnaemeka. (2014). Automated time-to-value measurement (U.S. Patent No. 8910146). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8910146

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