The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Jul. 15, 2013
Applicant:

Korea Institute of Geoscience and Mineral Resources, Daejeon, KR;

Inventors:

Heejun Suk, Daejeon, KR;

Kyoochul Ha, Daejeon, KR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01); G06F 17/14 (2006.01); G06F 17/10 (2006.01); G06F 7/60 (2006.01); G06G 7/50 (2006.01); G06F 17/13 (2006.01);
U.S. Cl.
CPC ...
G06F 17/13 (2013.01);
Abstract

Disclosed is a method of seeking semianalytical solutions to multispecies transport equations coupled with sequential first-order network reactions under conditions wherein a groundwater flow velocity and a dispersion coefficient vary spatially and temporally and boundary conditions vary temporally. This invention provides a method of seeking semianalytical solutions to dechlorination equations coupled with sequential first-order reactions, wherein analytical solutions to complex problems such as inhomogeneous media and unsteady flow are derived by combining a similarity transformation method of Clement and a generalized integral-transform technique (GITT), and are verified through comparison with 2DFATMIC which is a commercial numerical program, and thereby can be utilized in nuclear waste sites contaminated with radioactive materials and decayed daughter nuclides and industrial complexes contaminated with chlorinated organic solvents such as PCE (tetrachloroethene), TCE (trichloroethene) and biodegradable byproducts thereof, and can also be widely used in verification of developed numerical programs.


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