The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Dec. 16, 2011
Sylvia Scheu, Sandhausen, DE;
Matthias Buehl, Heidelberg, DE;
Boris Oliver Kneisel, Schwetzingen, DE;
Sylvia Scheu, Sandhausen, DE;
Matthias Buehl, Heidelberg, DE;
Boris Oliver Kneisel, Schwetzingen, DE;
SAP SE, Walldorf, DE;
Abstract
Various embodiments of systems and methods for pattern recognition of a distribution function are described herein. An influenced distribution function corresponding to an influenced attribute is compared with other distribution functions corresponding to other attributes. Based on the comparison, a correlation is determined between the influenced distribution function and an influencing distribution function from the other distribution functions. Based on the determination, a raw distribution function corresponding to an influenced attribute is extracted using the influenced distribution function and the influencing distribution function. The extracted raw distribution function and the influencing distribution function may be classified.