The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Dec. 15, 2009
Applicants:
Kristina N. Toutanova, Redmond, WA (US);
Colin Andrew Cherry, Ottawa, CA;
Hoifung Poon, Seattle, WA (US);
Inventors:
Kristina N. Toutanova, Redmond, WA (US);
Colin Andrew Cherry, Ottawa, CA;
Hoifung Poon, Seattle, WA (US);
Assignee:
Microsoft Corporation, Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 15/18 (2006.01); G10L 15/18 (2013.01);
U.S. Cl.
CPC ...
G10L 15/18 (2013.01);
Abstract
Described is a technology for performing unsupervised learning using global features extracted from unlabeled examples. The unsupervised learning process may be used to train a log-linear model, such as for use in morphological segmentation of words. For example, segmentations of the examples are sampled based upon the global features to produce a segmented corpus and log-linear model, which are then iteratively reprocessed to produce a final segmented corpus and a log-linear model.