The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Feb. 17, 2012
Applicants:

Kieran A. Carroll, Brampton, CA;

John Barry French, Oakville, CA;

Keith Richard William Morrison, Oakville, CA;

Inventors:

Kieran A. Carroll, Brampton, CA;

John Barry French, Oakville, CA;

Keith Richard William Morrison, Oakville, CA;

Assignee:

Gedex Inc., Mississauga, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); G01V 7/06 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G01V 7/06 (2013.01);
Abstract

Systems and methods for determining a bias-corrected value of at least one component of a gravity gradient tensor using a gravity gradiometer and a measurement bias of the gravity gradiometer wherein the measurement bias varies with time, by taking at least three measurements with the gravity gradiometer positioned in at least two orientations. Any gravity gradiometer can be used, including a Cross-Component Gravity Gradiometer (CCGG), an Orthogonal Quadrupole Responder (OQR), an In-Line Responder (ILR), a Diagonal-Component Gravity Gradiometer, or a Multi-Component Gravity Gradiometer (MCGG).


Find Patent Forward Citations

Loading…