The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jun. 23, 2011
Charles Bosworth, Oceanside, CA (US);
Charles Bosworth, Oceanside, CA (US);
Allergan, Inc., Irvine, CA (US);
Abstract
The present invention relates to an instrument and method for measuring the optical quality of an eye in a human subject. The instrument, which can be of either a single or double pass design and may include three-separate channels, permits real-time, simultaneous measurement of optical aberrations in the eye, retro-illumination of tear film to assess tear film stability, and scoring of psychophysical measures of visual performance. The simultaneous measurement of these parameters of optical quality and visual performance with the present instrument enables the operator to more accurately assess conditions and diseases of the eye, including dry eye disease (DED).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile