The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Feb. 28, 2012
Applicants:

Neil F. Hurley, Boston, MA (US);

Tuanfeng Zhang, Lexington, MA (US);

Weishu Zhao, Quincy, MA (US);

Mustafa AL Ibrahim, Safwa, SA;

Inventors:

Neil F. Hurley, Boston, MA (US);

Tuanfeng Zhang, Lexington, MA (US);

Weishu Zhao, Quincy, MA (US);

Mustafa Al Ibrahim, Safwa, SA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06G 7/50 (2006.01); G06G 7/48 (2006.01); G01N 21/64 (2006.01); E02D 1/00 (2006.01); E21B 49/00 (2006.01); E21B 41/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); E02D 1/00 (2013.01); E21B 49/00 (2013.01); E21B 41/00 (2013.01);
Abstract

This subject disclosure describes methods to build and/or enhance 3D digital models of porous media by combining high- and low-resolution data to capture large and small pores in single models. High-resolution data includes laser scanning fluorescence microscopy (LSFM), nano computed tomography (CT) scans, and focused ion beam-scanning electron microscopy (FIB-SEM). Low-resolution data includes conventional CT scans, micro computed tomography scans, and synchrotron computed tomography scans.


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