The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Feb. 23, 2011
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Yokohama, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Yokohama, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an X-ray imaging apparatus and an X-ray imaging method that offer an alternative for a refraction contrast method. A first scintillator and a second scintillator are used, the first scintillator generating first fluorescent light when X-rays separated by the separating element are incident thereon, and a second scintillator generating second fluorescent light when X-rays separated by the separating element are incident thereon. The second scintillator has a fluorescence emission intensity gradient such that an amount of emitted fluorescent light changes in accordance with a change in a position at which the X-rays are incident.