The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Nov. 16, 2011
Yoshiaki Murayama, Tokyo, JP;
Ikutoshi Fukushima, Tokyo, JP;
Yoshiaki Murayama, Tokyo, JP;
Ikutoshi Fukushima, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
Illuminating light is two-dimensionally scanned without changing the ability to focus the illuminating light on a specimen. Provided is a microscope apparatus including a spatial light modulator that modulates the wavefront of illuminating light; a scanner that two-dimensionally scans the illuminating light by pivoting two mirrors; a relay optical system that relays an image in the scanner to a pupil position of an objective optical system; and a beam-shift mechanism that moves rays of the illuminating light between the modulator and the objective optical system in response to pivoting of the mirrors. The beam-shift mechanism moves the rays such that the image at the pupil position, when assuming that the mirrors are stationary, is moved in the direction opposite to the direction in which the image relayed to the pupil position by the relay optical system, when assuming that the mirrors are pivoted with the rays fixed, is moved.