The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Aug. 21, 2013
Applicant:

Fuji Xerox Co., Ltd., Tokyo, JP;

Inventors:

Kiyofumi Aikawa, Kanagawa, JP;

Michio Kikuchi, Kanagawa, JP;

Takashi Hiramatsu, Kanagawa, JP;

Kazuya Fukunaga, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); G06K 15/00 (2006.01); G06F 3/12 (2006.01); G03G 15/00 (2006.01); G06K 9/00 (2006.01); B41J 29/393 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1872 (2013.01);
Abstract

When defects occur in four places of a print data region of a paper Pas illustrated in FIG.A, four code images are formed on an interleaving paper Pas illustrated in FIG.B, more specifically, four code images are formed on the interleaving paper Psuch that the positions of plural defect occurrence portions in the paper Pare aligned with the positions of plural code images formed in the interleaving paper P, respectively, and the sizes of the code images are made to be different depending on the defective degree of the defects occurring at the defect occurrence portions of the paper P, specifically, the larger the defective degree is, the larger the code image is.


Find Patent Forward Citations

Loading…