The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Mar. 13, 2013
National Applied Research Laboratories, Taipei, TW;
Wen-Yi Chang, Hsinchu, TW;
Franco Lin, Hsinchu, TW;
Lung-Cheng Lee, Hsinchu, TW;
Hung-Ta Hsiao, Hsinchu, TW;
Shou-I Chen, Hsinchu, TW;
Yu-Chi Sung, Hsinchu, TW;
Tai-Shan Liao, Hsinchu, TW;
Chih-Yen Chen, Hsinchu, TW;
National Applied Research Laboratories, Taipei, TW;
Abstract
The present invention relates to a method for measuring cracks remotely and the device thereof. First, multiple laser spots with known a shape are projected onto a remote wall and beside a crack. Then, by using geometric calculations, the relative coordinates of the laser spots on the wall and the real distance can be given and used as the reference length of the crack. Next, a camera is used for taking a picture of the remote crack along with the laser spots; the image identification technology is used for calculating the relevant parameters of the crack. Thereby, to acquire the parameters of the crack, a user needs not to be present at the site for measuring at a short distance or placing a reference object, and thus providing safety and convenience.