The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Feb. 19, 2010
Applicants:
Theo Tschudi, Darmstadt, DE;
Bernhard Braunecker, Rebstein, CH;
Inventors:
Theo Tschudi, Darmstadt, DE;
Bernhard Braunecker, Rebstein, CH;
Assignee:
Jos. Schneider Optische Werke GmbH, Bad Kreuznach, DE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/24 (2006.01); G01M 11/02 (2006.01); B24B 49/12 (2006.01); B24B 17/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01M 11/025 (2013.01); B24B 49/12 (2013.01); B24B 17/04 (2013.01);
Abstract
A method for zero-contact measurement of the topography of a spherically or aspherically curved air-glass surface of an optical lens or lens combination, distinguished in that the surface (S) to be measured is sampled on its glass rear side with an optical measurement beam through the air-glass surface (S) lying before it in the measurement direction. A device for carrying out the method is characterized in that