The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Dec. 20, 2011
Applicants:

Wilhelm Kettler, Wuppertal, DE;

Uwe Johansson, Erkrath, DE;

Inventors:

Wilhelm Kettler, Wuppertal, DE;

Uwe Johansson, Erkrath, DE;

Assignee:

Axalta Coating Systems IP Co., LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/52 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/524 (2013.01); G01J 3/50 (2013.01); G01J 3/504 (2013.01); G01J 3/52 (2013.01);
Abstract

The invention relates to a check-tile for validating instrument scales of color measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one opaque solid colored pigment, and B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment.


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