The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jul. 18, 2011
Applicant:
Olivier Acher, Gif-sur-Yvette, FR;
Inventor:
Olivier Acher, Gif-sur-Yvette, FR;
Assignee:
Horiba Jobin Yvon SAS, Longjumeau, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G01J 4/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G01J 4/00 (2013.01); G02B 21/0092 (2013.01);
Abstract
A polarimetric measurement device and method with microscopic resolution include a polarization conversion device to modify the polarization of a beam so as to switch from a spatially uniform distribution to a distribution that is cylindrically symmetric about the optical axis, and vice versa. The conversion device is positioned on the axis of a focusing objective for focusing the cylindrically symmetric polarized beam onto the surface of a sample to be measured. The device may be incorporated into a microellipsometer, or an interference contrast microscope, or used as a polarimetric accessory for a microscope.