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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8908179 B1

PDFFull Text
Date of Patent:
Dec. 09, 2014

Filed:

Mar. 16, 2012

Cuvette and optical measurement apparatus

Applicant:

Martin Ostermeyer, Gehrden, DE;

Inventor:

Martin Ostermeyer, Gehrden, DE;

Assignee:

Anton Paar GmbH, Graz, AT;

Attorneys:

Robert A. Blaha

Smith Risley Tempel Santos LLC

Primary Examiner:

Hoa Pham

Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/03 (2006.01); G01N 21/59 (2006.01); G01N 21/21 (2006.01); G01N 21/51 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 21/03 (2013.01); G01N 21/51 (2013.01); G01N 21/59 (2013.01); G01N 21/645 (2013.01); G01N 2021/0346 (2013.01);
Abstract

A cuvette comprising a cuvette wall for limiting a sample reception space for receiving a fluid sample is disclosed. The cuvette wall is adapted to allow a traversal of measurement radiation through the fluid sample situated within the sample reception space. An information presenter is fixed at the cuvette wall. The information presenter wirelessly provides data to be transferred to an external data reception module. The data to be transferred relates to the cuvette. Further, an optical measurement apparatus is described.

Find Patent Forward Citations

Ostermeyer, Martin. (2014). Cuvette and optical measurement apparatus (U.S. Patent No. 8908179). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8908179

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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