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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8908176 B1

PDFFull Text
Date of Patent:
Dec. 09, 2014

Filed:

Jan. 15, 2013

Apparatus and method for obtaining spectral characteristics

Applicants:

Yoichi Kubota, Tokyo, JP;

Naoko Shigemori, Tokyo, JP;

Naohiro Kamijo, Kanagawa, JP;

Kohei Shimbo, Kanagawa, JP;

Manabu Seo, Kanagawa, JP;

Inventors:

Yoichi Kubota, Tokyo, JP;

Toshihiro Shigemori, Kanagawa, JP;

Naohiro Kamijo, Kanagawa, JP;

Kohei Shimbo, Kanagawa, JP;

Manabu Seo, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:

IPUSA, PLLC

Primary Examiner:

Kara E Geisel

Assistant Examiner:

Dominic J Bologna

Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/46 (2006.01); H03F 1/26 (2006.01); H04B 15/00 (2006.01); G01J 3/42 (2006.01); G01J 3/50 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01J 3/463 (2013.01); G01J 3/501 (2013.01); G01J 3/027 (2013.01); G01J 2003/466 (2013.01);
Abstract

A spectral characteristic obtaining apparatus includes a detection unit detecting light quantities in plural wavelength bands from a measurement target, a storage unit storing pre-obtained spectral characteristics of the measurement target, a calculation unit calculating a primary transformation matrix from the light quantities and the pre-obtained spectral characteristics of at least one reference sample and a secondary transformation matrix from one of the pre-obtained spectral characteristics corresponding to a primary wavelength band and another one of the pre-obtained spectral characteristics corresponding to a secondary wavelength band, an estimation unit estimating the spectral characteristics of the measurement target by performing a primary estimation on the light quantities in the plural wavelength bands by using the primary transformation matrix, performing a secondary estimation on a result of the primary estimation by using the secondary transformation matrix, and compositing a result of the secondary estimation with the result of the primary estimation.

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