The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jun. 24, 2010
Applicants:
Bernhard Metzler, Dornbirn, AT;
Bernd Walser, Heerbrugg, CH;
Beat Aebischer, Heerbrugg, CH;
Inventors:
Assignee:
Leica Geosystems AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); G05B 2219/37008 (2013.01); G05B 2219/37009 (2013.01); G05B 2219/37015 (2013.01); G05B 2219/37017 (2013.01); G05B 2219/37567 (2013.01);
Abstract
According to the invention, the calibration measuring cycle is divided into several, particularly a plurality of partial cycles, with which one or more of the calibration measurements are associated. While maintaining the cycle, the partial cycles are now carried out in one of the positioning pauses such that the calibration measuring cycle is distributed over several, in particular a plurality of, positioning pauses and is integrated into the flow of the industrial process without interfering with the same.