The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jul. 18, 2012
Bernhard Holzmayer, Hohenstein, DE;
Michael Halter, Pfullingen, DE;
Bernhard Holzmayer, Hohenstein, DE;
Michael Halter, Pfullingen, DE;
Institut Dr. Foerster GmbH & Co. KG, Reutlingen, DE;
Abstract
A method for testing the material of a test object () in a nondestructive manner, said test object being moved relative to a probe () at a variable relative speed, comprises the following steps: detecting a probe signal (US) by means of the probe (), subjecting the probe signal (US) to analog-to-digital conversion in order to generate a digitized probe signal (USD) in the form of a sequence of digital words with a predefined, in particular constant, word repetition rate, n-stage decimation of the word repetition rate of the digitized probe signal (USD) or of a digital demodulation signal (UM) derived from the digitized probe signal by means of n cascaded decimation stages (_to_n), where n≧2, selecting an output signal (UA_to UA_n) of one of the n decimation stages (_to_n) depending on the instantaneous relative speed and filtering the selected output signal by means of a digital filter (), which is clocked with the word repetition rate of the selected output signal.