The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
May. 25, 2012
Xiaoping Tan, Guangdong, CN;
Nianmao Wang, Guangdong, CN;
Xiaoping Tan, Guangdong, CN;
Nianmao Wang, Guangdong, CN;
Shenzhen China Star Optoelectronics Technology Co., Ltd., Guangming New District, Shenzhen, Guangdong, CN;
Abstract
A detecting method of abnormality of a differential signal receiving terminal of a liquid crystal displaying module, including: inputting high level signals to LVDS+, LVDS−, LVDS+, LVDS− in order, in which only one high level signal is inputted to one of the differential signal lines and the other differential signal lines are kept in high impedance states simultaneously; and receiving feedback signals from all the differential signal lines and determining whether the differential signal lines of detecting units are abnormal or not according to the received feedback signals. The abnormality of the differential signal lines includes terminal resistive opens of the differential signal lines, a short circuit between two adjacent groups of differential signal lines, and short circuits of the differential signal lines to ground or to a power supply caused by abnormal power supplying sequence. By inputting high level signals to the differential signal lines in order and receiving the feedback signal from each differential signal line, the abnormality of the receiving terminal can be detected quickly according to the received feedback signals. This not only reduces the labor cost and time cost, but also improves the detecting efficiency of the abnormality.