The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Jan. 29, 2010
Applicants:

Teimour Maleki, West Lafayette, IN (US);

Babak Ziaie, West Lafayette, IN (US);

Saeed Mohammadi, Zionsville, IN (US);

Inventors:

Teimour Maleki, West Lafayette, IN (US);

Babak Ziaie, West Lafayette, IN (US);

Saeed Mohammadi, Zionsville, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01);
Abstract

A method for forming a nanofluidic channel measuring system is disclosed. The method includes forming a first trench in a substrate, forming a second trench in the substrate, the first trench and the second trench are separated by a first width, providing a first conductor pad at a first location, providing a second conductor pad at a second location, forming a first nano-wire for coupling the first conductor pad with the second conductor pad, and forming a nano-channel through the first nano-wire, the nano-channel also coupling the first trench and the second trench, the nano-channel configured to sever the first nano-wire. A nanofluidic channel measuring system is also disclosed.


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