The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Jul. 30, 2010
Applicants:

Amir Saroka, Tel-Aviv, IL;

Nadav Mizrahi, Tel-Aviv, IL;

Dan Rappaport, Tel-Aviv, IL;

Shlomi Bergida, Tel-Aviv, IL;

Inventors:

Amir Saroka, Tel-Aviv, IL;

Nadav Mizrahi, Tel-Aviv, IL;

Dan Rappaport, Tel-Aviv, IL;

Shlomi Bergida, Tel-Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01);
Abstract

A method of calibrating a measurement of electromagnetic (EM) signals. The method comprises separating at least one reference signal component from an EM signal, delaying at least one of the EM signal and the at least one reference signal component, extracting the EM signal after an interaction with a target object and the at least one reference signal component after at least one interaction with at least one reference element from different time slots in a reception, and calibrating a measurement of the interacted EM signal by a signal analysis of the extracted and interacted at least one reference signal component.


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