The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Nov. 15, 2012
Applicant:

Shanghai Hua Nec Electronics Co., Ltd., Shanghai, CN;

Inventors:

Fan Chen, Shanghai, CN;

Xiongbin Chen, Shanghai, CN;

Kai Xue, Shanghai, CN;

Keran Xue, Shanghai, CN;

Jia Pan, Shanghai, CN;

Hao Li, Shanghai, CN;

Ying Cai, Shanghai, CN;

Xi Chen, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/735 (2006.01); H01L 29/73 (2006.01); H01L 29/04 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 29/06 (2006.01); H01L 29/45 (2006.01);
U.S. Cl.
CPC ...
H01L 29/73 (2013.01); H01L 29/456 (2013.01); H01L 29/735 (2013.01); H01L 29/04 (2013.01); H01L 29/66234 (2013.01); H01L 29/1008 (2013.01); H01L 29/6625 (2013.01); H01L 29/0649 (2013.01);
Abstract

A parasitic lateral PNP transistor is disclosed, in which, an N-type implanted region formed in each of two adjacent active regions forms a base region; a P-type doped polysilicon pseudo buried layer located under a shallow trench field oxide region between the two active regions serves as an emitter; and a P-type doped polysilicon pseudo buried layer located under each of the shallow trench field oxide regions on the outer side of the active regions serves as a collector region. The transistor has a C-B-E-B-C structure which alters the current path in the base region to a straight line, which can improve the current amplification capacity of the transistor and thus leads to a significant improvement of its current gain and frequency characteristics, and is further capable of reducing the area and increasing current intensity of the transistor. A manufacturing method of the parasitic lateral PNP transistor is also disclosed.


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