The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jun. 08, 2012
Chang Lyong Kim, Brookfield, WI (US);
David Leo Mcdaniel, Dousman, WI (US);
James Lindgren Malaney, Brookfield, WI (US);
William Todd Peterson, Sussex, WI (US);
Vi-hoa Tran, Pewaukee, WI (US);
Ashwin Ashok Wagadarikar, Clifton Park, NY (US);
Chang Lyong Kim, Brookfield, WI (US);
David Leo McDaniel, Dousman, WI (US);
James Lindgren Malaney, Brookfield, WI (US);
William Todd Peterson, Sussex, WI (US);
Vi-Hoa Tran, Pewaukee, WI (US);
Ashwin Ashok Wagadarikar, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for gain calibration of a gamma ray detector includes measuring signals generated by one or more light sensors of a gamma ray detector, generating one or more derived curves using the measured signals as a function of bias voltage and identifying a transition point in the one or more derived curves. The method also includes determining a breakdown voltage of the one or more light sensors using the identified transition point and setting a bias of the one or more light sensors based on the determined breakdown voltage.