The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Apr. 29, 2010
Applicants:

Tania Q. VU, Portland, OR (US);

Brian R. Long, Portland, OR (US);

Benjamin K. Scholl, Portland, OR (US);

Inventors:

Tania Q. Vu, Portland, OR (US);

Brian R. Long, Portland, OR (US);

Benjamin K. Scholl, Portland, OR (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); B82Y 15/00 (2011.01); C40B 30/10 (2006.01); G01N 33/58 (2006.01); G01N 33/561 (2006.01);
U.S. Cl.
CPC ...
G01N 33/588 (2013.01); G01N 33/561 (2013.01); B82Y 15/00 (2013.01); Y10S 977/904 (2013.01); Y10S 977/778 (2013.01);
Abstract

An apparatus and method for counting nanoparticle probes is disclosed. In one embodiment, quantum dot-tagged proteins on optically transparent membranes or slides are counted. The transparent membranes or slides are loaded onto a stage (e.g., an X-Y stage or X-Y-Z stage), which can automatically reposition the transparent membrane or slides for image capture at varying locations. A microscope can be used for providing a light source to fluoresce the nanocrystals and for providing the magnification needed for image capture. Once one or more images are captured, the nanoparticles can be automatically counted using post-processing software that maintains a total count across multiple images, if desired.


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