The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
Jan. 03, 2012
Michael Renxun Wang, Miami, FL (US);
Michael Renxun Wang, Miami, FL (US);
Abstract
A method and system for evaluation tear film thickness and thinning dynamics in an eye with or without wearing a contact lens using a specially configured optical reflectometer. The method and system may address the beam aiming flexibility on the tear film surface by incorporation of a galvanometer scanner with the fiber coupled optical reflectometer. The tear film thickness, tear film thinning dynamics, and tear film breakup thickness can be determined. The system can also be combined with spectral domain OCT or swept source OCT for ophthalmology applications. The advantage is fast and high precision tear film evaluation that can also be extended to water film on contact lens evaluation for the determination of contact lens hydrophilic properties.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile