The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Oct. 14, 2010
Applicants:

Andreas Berger, Hasel-Glashutten, DE;

Michal Bezdek, Aesch, SE;

Arno Lang, Mullheim, DE;

Inventors:

Andreas Berger, Hasel-Glashutten, DE;

Michal Bezdek, Aesch, SE;

Arno Lang, Mullheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 19/00 (2006.01); G01F 1/66 (2006.01);
U.S. Cl.
CPC ...
G01F 1/667 (2013.01); G01F 1/662 (2013.01);
Abstract

A method for the manufacture of a measuring device, and a measuring device for registering at least one measured value of at least one process variable, wherein the measuring device includes a measuring tube, which has at least one necked out portion, on which at least one measuring transducer is arranged, wherein the measuring tube together with the necked out portion is monolithic, and wherein the necked out portion is manufacturable from the measuring tube at least partially by a deformation method.


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